EVIDENCE OF ELECTRONIC CONFINEMENT IN PSEUDOMORPHIC SI GAAS SUPERLATTICES/

Citation
V. Spagnolo et al., EVIDENCE OF ELECTRONIC CONFINEMENT IN PSEUDOMORPHIC SI GAAS SUPERLATTICES/, Physical review. B, Condensed matter, 57(24), 1998, pp. 15100-15103
Citations number
25
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
57
Issue
24
Year of publication
1998
Pages
15100 - 15103
Database
ISI
SICI code
0163-1829(1998)57:24<15100:EOECIP>2.0.ZU;2-U
Abstract
We report the observation of coupling between intersubband plasmons an d longitudinal-optical phonons in Si/GaAs superlattices pseudomorphica lly grown on GaAs-(001). Measurement of both phononlike (I-) and plasm onlike (I+) coupled modes by Raman scattering unambiguously demonstrat ed electronic confinement within pseudomorphic Si layers and allowed u s to determine the 0-->1 intersubband transition energy. Comparison wi th the results of tight-binding calculations indicated a type-I band a lignment across the Si/GaAs heterojunctions, with a conduction-band of fset of 0.61 eV and a valence-band offset of 0.25 eV.