The long relaxation of the space-charge-limited conductivity due to th
e space charge prepared by an injection of the electrons in various n(
+)-i-n(+) devices has been studied in detail. The increase of the cond
uctivity at long times can be expressed by the simple relation which i
s a function of the density of states. Measurements of the relaxation
process together with measurements of space-charge-limited currents en
abled to determine the magnitude of the attempt-to-escape frequency fo
r the undoped a-Si:H in the range (9-14) X 10(10) s(-1) using n(+)-i-n
(+) devices prepared in different laboratories. (C) 1998 Elsevier Scie
nce B.V. All rights reserved.