PHOTOCONDUCTIVE PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON IN THE LIGHT OF THE POSITIVE DANGLING BOND AS THE MAIN RECOMBINATION CENTER - CONSEQUENCES FROM THE DEFECT POOL MODEL
R. Bruggemann et Gh. Bauer, PHOTOCONDUCTIVE PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON IN THE LIGHT OF THE POSITIVE DANGLING BOND AS THE MAIN RECOMBINATION CENTER - CONSEQUENCES FROM THE DEFECT POOL MODEL, Journal of non-crystalline solids, 230, 1998, pp. 197-200
We discuss the photoconductive properties of hydrogenated amorphous si
licon in the presence of comparable numbers of neutral and charged dan
gling bond defects and in particular for the defect distribution accor
ding to the defect pool model. We numerically model transient and modu
lated photoconductivity experiments. Analysis of time-of-flight data i
dentifies the deep-trapping time with the capture time into the positi
ve dangling bond. Testing numerically the equivalence of secondary tra
nsient and modulated photoconductivity employed for spectroscopic purp
oses, we reproduce the experimental optical bias effect in the modulat
ed photocurrent spectra and the related change in the reconstructed de
nsity of states. We suggest performing these spectroscopic experiments
with a series of slightly p-type doped samples for which the numerica
l modelling reveals two differently shaped reconstructed density of st
ate profiles for either the defect pool or a single defect band distri
bution. (C) 1998 Elsevier Science B.V. All rights reserved.