Conductive wires are fabricated by electron-beam-induced deposition. I
n fabrication, the deposition property of the beam-induced process has
been demonstrated using rate equations describing precursor molecule
supply and consumption by electron irradiation. Repeated electron beam
line scanning is thought to be more effective in wire fabrication tha
n single slow scanning. Conditions arise, however, where the result is
other than anticipated. Results are explained by the secondary electr
ons emitted by the primary electron beam considering the angle depende
nce of the secondary electron yield.