In. Volovichev et al., RELIABLE RECTIFIERS AND PHOTOVOLTAIC CONVERTERS FOR HIGH-LEVELS OF IONIZING IRRADIATION, Microelectronics, 29(8), 1998, pp. 535-542
Nonlinear charge carrier transport has been investigated for the metal
-intrinsic semiconductor-metal (M-i-M) and heterojunction of two intri
nsic semiconductor (i-i) structures. It is shown that if the film thic
kness is of the order of the Debye screening radius, the current-volta
ge characteristics of these structures become comparable to those obse
rved for the usual junctions at the base of doped semiconductors. The
possibility of solid-state electronic devices at the base of M-i-M and
i-i thin film structures is demonstrated. For intrinsic semiconductor
s, using semiconductors of the In2Te3 type, which cannot be effectivel
y doped, but possess extremely high radiation stability, permits one t
o create a family of electronic devices for application under conditio
ns of very high levels of ionizing irradiation. (C) 1998 Published by
Elsevier Science Ltd. All rights reserved.