NONLINEAR-OPTICAL INTERFEROMETRY AND 2ND-HARMONIC GENERATION SPECTROSCOPY OF LANGMUIR FILMS OF FULLERENE-INDOPANE DERIVATIVE

The thickness dependence of the nonlinear optical parameters of C-60-i ndopane Langmuir-Schaefer films in the range of 1-15 monolayers was st udied by means of second harmonic generation (SHG) spectroscopy and in terferometry. Both the spectral dependence of the SHG intensity and th e relative-phase of the second harmonic (SH) wave was measured. The th ickness dependence of the SHG parameters shows a regular behavior abov e 5 monolayers, being irregular for thinner films. The observed strong wavelength dependence of the SHG intensity is caused by near double ( for the fundamental and SH waves) resonant conditions. (C) 1998 Elsevi er Science B.V. All rights reserved.