MODELING THE ATOMIC DENSITY ACROSS A SOLID-LIQUID INTERFACE

Citation
Wj. Huisman et Jf. Vanderveen, MODELING THE ATOMIC DENSITY ACROSS A SOLID-LIQUID INTERFACE, Surface science, 404(1-3), 1998, pp. 866-870
Citations number
11
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
404
Issue
1-3
Year of publication
1998
Pages
866 - 870
Database
ISI
SICI code
0039-6028(1998)404:1-3<866:MTADAA>2.0.ZU;2-R
Abstract
From the specular X-ray reflectivity from an interface between two med ia one may derive the local atomic density distribution. In this work, models for the density profile across a solid-liquid interface are in troduced. We concentrate on models in which the liquid is stratified n ear the solid wall. The calculations are compared with the measured X- ray reflectivity from the Ga-diamond (111)-2 x 1 interface. It appears that the liquid near the diamond surface already assumes a solid-like structure similar to that of the alpha-Ga phase. (C) 1998 Elsevier Sc ience B.V. All rights reserved.