J. Cifre et Jp. Roger, ABSOLUTE INFRARED-ABSORPTION MEASUREMENTS IN OPTICAL COATINGS USING MIRAGE DETECTION, Thin solid films, 320(2), 1998, pp. 198-205
Absolute measurements of the optical absorption at lambda = 10.6 mu m
of BaF2 thin film grown on a ZnSe substrate and bare ZnSe substrate su
rface were performed by collinear photothermal deflection technique. A
bsorption values were obtained in an absolute manner by fitting experi
mental data to the theoretical expressions of beam deflection for two
particular cases: when thermal wave extends far from the laser spot an
d the opposite, when the heated region does not stretch beyond the las
er spot. The validity of the theoretical models were tested in the ran
ge of modulation frequencies from 20 Hz to 2700 Hz. This method was al
so applied to the analysis of fused silica and sapphire bulk samples i
n order to be used as reference absorbing media in the infrared spectr
al range. Optical absorption of BaF2 thin film and ZnSe substrate surf
ace were also deduced from the same theoretical approach using sapphir
e as a bulk reference medium. From both calculation methods an absorpt
ance of 1200 ppm for RaF2 thin film and of 425 ppm for ZnSe plate surf
ace were measured. (C) 1998 Elsevier Science S.A, All rights reserved.