A study was made of the screening of excitons in a GaN sample, which w
as simultaneously excited with a HeCd laser and an Ar+ ion laser. The
Ar+ ion laser excites carriers in a two step process, involving an imp
urity or defect. A comparison with transport measurements shows that t
he photoluminescence is probably emitted from a higher-quality portion
of the sample than that which conducts the current.