G. Portalone et al., MOLECULAR-STRUCTURE OF PHENYLSILANE - A STUDY BY GAS-PHASE ELECTRON-DIFFRACTION AND AB-INITIO MOLECULAR-ORBITAL CALCULATIONS, Journal of organometallic chemistry, 560(1-2), 1998, pp. 183-190
The molecular structure of phenylsilane has been determined accurately
by gas-phase electron diffraction and ab initio MO calculations at th
e MP2(f.c.)/6-31G level. The calculations indicate that the perpendic
ular conformation of the molecule, with a SI-H bond in a plane orthogo
nal to the plane of the benzene ring, is the potential energy minimum.
The coplanar conformation, with a Si-H bond in the plane of the ring,
corresponds to a rotational transition state. However, the difference
in energy is very small, 0.13 kJ mol(-1), implying free rotation of t
he substituent at the temperature of the electron diffraction experime
nt (301 K). Important bond lengths from electron diffraction are: < r(
g)(C-C) > = 1.403 +/- 0.003 Angstrom, r(g)(Si-C) = 1.870 +/- 0.004 Ang
strom, and r(g)(Si-H) = 1.497 +/- 0.007 Angstrom. The calculations ind
icate that the C-ipso-C-ortho bonds are 0.010 Angstrom longer than the
other C-C bonds. The internal ring angle at the ipso position is 118.
1 +/- 0.2 degrees from electron diffraction and 118.0 degrees from cal
culations. This confirms the more than 40-year old suggestion of a pos
sible angular deformation of the ring in phenylsilane, in an early ele
ctron diffraction study by F.A. Keidel, S.H. Bauer, J. Chem. Phys. 25
(1956) 1218. (C) 1998 Elsevier Science S.A. All rights reserved.