THERMAL EVOLUTION OF MAGNETIC-PROPERTIES OF THIN-FILMS HAVING PERPENDICULAR ANISOTROPY

In this work we report on the temperature evolution (10K-470K) of the magnetization processes of amorphous FexSi1-x thin films having perpen dicular anisotropy. The film thickness was close to 100 nm. Hysteresis loops show the extinction of stripe domains at a critical temperature of T-c approximate to 250K. In order to analyze possible changes in a nisotropies (perpendicular and in-plane) throughout the film thickness , we compare bulk properties measured by Alternating Gradient Magnetom eter (AGM) with results obtained from MOKE at both film interfaces.