Jp. Sinnecker et al., AN AUTOMATED-SYSTEM FOR MEASURING THE COMPLEX IMPEDANCE AND ITS RELAXATION IN SOFT-MAGNETIC MATERIALS, Journal de physique. IV, 8(P2), 1998, pp. 665-668
A fully automated system, designed to measure both components or the i
mpedance as functions of applied field (up to 130 Oe), current intensi
ty (up to 20 mA) and frequency (up to 1 MHz), is presented. Also, this
apparatus allows impedance relaxation to be recorded. High sensitivit
y is achieved by using lock-in technique, and weak relative changes of
the impedance, down to an order or 0.1%, can be observed.