AN AUTOMATIC METHOD OF MEASURING THE CRYSTALLOGRAPHIC ORIENTATIONS OFFE-SI ALLOYS USING ELECTRON SCAN MICROSCOPE IMAGE-PROCESSING AND ETCHPITTING

Citation
Jp. Goglio et al., AN AUTOMATIC METHOD OF MEASURING THE CRYSTALLOGRAPHIC ORIENTATIONS OFFE-SI ALLOYS USING ELECTRON SCAN MICROSCOPE IMAGE-PROCESSING AND ETCHPITTING, Journal de physique. IV, 8(P2), 1998, pp. 677-680
Citations number
5
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
8
Issue
P2
Year of publication
1998
Pages
677 - 680
Database
ISI
SICI code
1155-4339(1998)8:P2<677:AAMOMT>2.0.ZU;2-B
Abstract
we propose a new method of measuring the crystallographic orientations for metallurgical applications. This method involves measuring these orientations by electron scan microscope image computing. After image segmentation obtained through the use of an algorithm that makes an ar ea approach and an edge detector using spline functions work together, we classify these areas in three different categories. To separate tw o of them, we have to make an edge detection using multi-scale laplaci an, and a skeletonization. This latter operation is computed with a tw o-step thinning algorithm, with different criteria to prevent the form ation of unexpected segments. At the end, a specific measure was made for each of the three kinds of images, in order to extract the crystal lographic orientations of any textured iron sheet.