This paper describes a series of experiments performed to isolate the
RF breakdown mechanisms in the hard tube magnetically insulated transm
ission line oscillator (MILO) Experiment at the Air Force Phillips Lab
oratory, Albuquerque, NM. Specifically, several causes of RF breakdown
in the region of the vacuum-air interface and the antenna region have
been investigated. These causes are X-ray induced electron emission,
VUV and visible photoemission of electrons, and breakdown due to large
field stresses in the antenna. Each of these mechanisms has the effec
t of liberating electrons from a surface in a high field region which
then are a seed for a breakdown. This paper discusses measurements in
the X-ray, VUV, and visible regimes with support from computer simulat
ion. Also, imagery results are shown, which in conjunction with the co
mputer work, point to the presence of high electric field stresses in
the antenna, which cause a subsequent breakdown. In particular, X-rays
, VUV, visible light, and plasmas do not seem to be the major source o
f RF breakdown in this tube.