EXAMINATION OF GLASS FOR GLASS-LINED DISCHARGE ELECTRODES

Citation
T. Maeseto et al., EXAMINATION OF GLASS FOR GLASS-LINED DISCHARGE ELECTRODES, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 106(6), 1998, pp. 627-630
Citations number
10
Categorie Soggetti
Material Science, Ceramics
ISSN journal
09145400
Volume
106
Issue
6
Year of publication
1998
Pages
627 - 630
Database
ISI
SICI code
0914-5400(1998)106:6<627:EOGFGD>2.0.ZU;2-C
Abstract
In this work, we studied the effect of various elements on the relativ e dielectric constant, epsilon(r), by adding 1-3 mol% of an element to soda glass, 15Na(2)O . 15CaO . 70SiO(2), the mother glass. The struct ure of the dielectric coating layer for the glass-lined discharge elec trode was investigated in terms of the breakdown voltage and epsilon(r ). It was found that most rare-earth elements (Pr, Lu, Eu, Gd, Sm) are more effective in increasing epsilon(r) than other elements. From the viewpoint of the breakdown voltage of the glass-lined layer, it is de sirable that a cover coating with a high epsilon(r) is directly coated onto the base metal without using a ground coating with low epsilon(r ), to obtain the optimum improvement effects. As the results of experi ments, the 3CoO . 3NiO . 3MnO(2) . 3Pr(6)O(11). 30Bi(2)O(3). 20BaO . 5 0B(2)O(3) (mol%; CNMPBBB) glass was found to have a high epsilon(r), o f 16 and good adhesion with steel. CNMPBBB glass is highly promising f or use in glass-lined discharge electrodes.