SPECULAR AND NON-SPECULAR X-RAY REFLECTION FROM INORGANIC AND ORGANICMULTILAYERS

Authors
DEBOER DKG LEENAERS AJG VANDERWIELEN MWJ STUART MAC FLEER GJ NIEUWHOF RP MARCELIS ATM SUDHOLTER EJR
Citation
Dkg. Deboer et al., SPECULAR AND NON-SPECULAR X-RAY REFLECTION FROM INORGANIC AND ORGANICMULTILAYERS, Physica. B, Condensed matter, 248, 1998, pp. 274-279
Citations number
21
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica. B, Condensed matter → ACNP
ISSN journal
09214526
Volume
248
Year of publication
1998
Pages
274 - 279
Database
ISI
SICI code
0921-4526(1998)248:<274:SANXRF>2.0.ZU;2-Z
Abstract
Specular and non-specular X-ray reflectivity measurements can be explo ited to obtain interesting properties of layered materials such as ele ctron-density profile and lateral and perpendicular structure of inter face roughness. This will be illustrated using results on a nickel-car bon multilayer and a liquid-crystalline polymer. (C) 1998 Elsevier Sci ence B.V. All rights reserved.