Titanium is an extremely reactive element which is known to promote th
e wetting of ceramics by liquid metals. The wetting process is believe
d to be controlled by the segregation of a very thin layer of Ti to th
e metal/ceramic interface where it undergoes a localised redox reactio
n with the ceramic. This hypothesis is consistent with cross-sectional
microanalysis studies of metal-ceramic interfaces where thin layers o
f substoichiometric titanium oxides have been identified. The study of
titanium segregation is ideally suited to neutron reflection because
of the negative scattering length of the dominant isotope. In this stu
dy we have characterised the chemical composition of three interfaces
between metals and a sapphire (Al2O3) single crystal using specular ne
utron reflection. The interfaces are: Sn/sapphire, Sn/sapphire contain
ing a thin (approximate to 20 nm) Ti interlayer introduced by physical
vapour deposition (PVD), and an interface between sapphire and a comm
ercial Ag-Cu-Ti alloy used to braze ceramics. We have evaluated the ne
utron reflection data collected from the CRISP reflectometer at the IS
IS facility using a multilayer model of the interface. The results ind
icate that the 20 nm evaporated layer cannot be distinguished from int
erface roughness while the interface between sapphire and the commerci
al braze alloy contains a thin (approximate to 70 nm) titanium suboxid
e layer. (C) 1998 Elsevier Science B.V. All rights reserved.