ADAM, THE NEW REFLECTOMETER AT THE ILL

Authors
SCHREYER A SIEBRECHT R ENGLISCH U PIETSCH U ZABEL H
Citation
A. Schreyer et al., ADAM, THE NEW REFLECTOMETER AT THE ILL, Physica. B, Condensed matter, 248, 1998, pp. 349-354
Citations number
9
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica. B, Condensed matter → ACNP
ISSN journal
09214526
Volume
248
Year of publication
1998
Pages
349 - 354
Database
ISI
SICI code
0921-4526(1998)248:<349:ATNRAT>2.0.ZU;2-T
Abstract
The new reflectometer ADAM at the ILL is described and some of the res ults obtained in the first year of operation are presented. These incl ude a reflectivity of a Si wafer over eight orders of magnitude, a mea surement of a thick [Fe-56/Fe-57] isotope superlattice, and a polarise d reflectivity of a Co/Cu multilayer. The instrument is now available to outside users. (C) 1998 Elsevier Science B.V. All rights reserved.