SYNCHROTRON X-RAY REFLECTIVITY STUDY OF CO CU MULTILAYER STRUCTURE/

We report on the use of Station 2.3 at the SRS Daresbury Laboratory as a high resolution reflectivity diffractometer (HRRD) for the study of interfacial structure in a Co/Cu multilayer grown using the ion-assis ted deposition method. Specular, off-specular and diffuse X-ray scatte ring measurements were obtained from interfaces grown with concurrent ion bombardment under selected deposition conditions. The present work has successfully demonstrated that the HRRD instrument is a viable to ol for the structural study of the Co/Cu system. In addition, the refl ectivity results have revealed some of the growth mechanisms involved and possible conditions for the optimisation of smooth multilayer inte rfaces with minimal disorder. (C) 1998 Elsevier Science B.V. All right s reserved.