TEXTURE DETERMINATION BY ENERGY-DISPERSIVE XRD

Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for determination of crystallographic texture, an d we present an instrument for use on Station 16.4 of the Daresbury SR S, designed primarily for texture studies on surface layers. The instr ument allows measurement at low angles of incidence to enhance surface sensitivity. It can typically acquire texture information at 176 (psi , phi) orientation points in around 2 h, and provides a complete set o f pole figures simultaneously. (C) 1998 Elsevier Science B.V. All righ ts reserved.