OPTIMIZATION OF GROWTH-CONDITIONS FOR STRAINED SI SI1-YCY STRUCTURES/

Citation
Kb. Joelsson et al., OPTIMIZATION OF GROWTH-CONDITIONS FOR STRAINED SI SI1-YCY STRUCTURES/, Thin solid films, 321, 1998, pp. 15-20
Citations number
17
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
321
Year of publication
1998
Pages
15 - 20
Database
ISI
SICI code
0040-6090(1998)321:<15:OOGFSS>2.0.ZU;2-0
Abstract
Preparation of Si1-yCy/Si(001) and Si/Si1-xGex/Si1-yCy/Si(001) heteros tructures using molecular beam epitaxy (MBE) with C obtained from subl imation of SiC in a high-temperature cell is reported. Accumulation of surface roughness is found to occur during growth of C-rich layers ev entually leading to a reduction of the C-induced strain. The roughness can be suppressed at increased growth rates and/or decreased substrat e temperature during growth of Si1-yCy layers. Modulation of the growt h temperature has been found advantageous for optimizing both the morp hology and photoluminescence properties. Near band-edge luminescence f rom Si1-yCy/Si multiple quantum well (MQW) structures has been observe d and a conduction band edge shift equal to 63 meV/% C has been deduce d from an effective mass calculation. (C) 1998 Elsevier Science S.A. A ll rights reserved.