We have investigated the size distribution of germanium islands deposi
ted onto a Si0.84Ge0.16 buffer layer, by atomic force microscopy. The
size distribution was found to be bimodal at 630-740 degrees C and con
sisted of one group of smaller 'pyramidal' islands with a broad distri
bution of diameters and heights and another group of larger 'spherical
' islands with a narrow distribution of diameters and heights. Both th
e size of the islands and the critical size for the change-over betwee
n the two growth modes are strongly temperature-dependent and decrease
with decreasing temperature. To explain the origin of this bimodality
, we have conducted experiments where the amount of material and the t
emperature were varied. We suggest that the bimodal size distribution
and the temperature-dependent change-over between the two growth modes
can be explained by an interplay between energetics and kinetics. (C)
1998 Elsevier Science S.A. All rights reserved.