In this paper we present recent investigations on the growth of buried
single crystalline CoSi2 layers in Si(100) by molecular beam allotaxy
. By this growth method the layer formation takes place during a rapid
high temperature anneal of silicide precipitates embedded in the Si(1
00) matrix. During the anneal the precipitates coarsen and coalesce in
to a uniform layer. The results show that, under certain conditions, s
elf-ordering of the precipitates evolves during the anneal in accordan
ce with recent computer simulation. (C) 1998 Elsevier Science S.A. All
rights reserved.