SELF-ORDERING OF COSI2 PRECIPITATES AND EPITAXIAL LAYER GROWTH OF COSI2 ON SI(100)

Citation
S. Mantl et al., SELF-ORDERING OF COSI2 PRECIPITATES AND EPITAXIAL LAYER GROWTH OF COSI2 ON SI(100), Thin solid films, 321, 1998, pp. 251-255
Citations number
18
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
321
Year of publication
1998
Pages
251 - 255
Database
ISI
SICI code
0040-6090(1998)321:<251:SOCPAE>2.0.ZU;2-F
Abstract
In this paper we present recent investigations on the growth of buried single crystalline CoSi2 layers in Si(100) by molecular beam allotaxy . By this growth method the layer formation takes place during a rapid high temperature anneal of silicide precipitates embedded in the Si(1 00) matrix. During the anneal the precipitates coarsen and coalesce in to a uniform layer. The results show that, under certain conditions, s elf-ordering of the precipitates evolves during the anneal in accordan ce with recent computer simulation. (C) 1998 Elsevier Science S.A. All rights reserved.