CUINSE2 THIN-FILMS GROWN BY MOCVD - CHARACTERIZATION, FIRST DEVICES

Citation
Mc. Artaud et al., CUINSE2 THIN-FILMS GROWN BY MOCVD - CHARACTERIZATION, FIRST DEVICES, Thin solid films, 324(1-2), 1998, pp. 115-123
Citations number
49
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
324
Issue
1-2
Year of publication
1998
Pages
115 - 123
Database
ISI
SICI code
0040-6090(1998)324:1-2<115:CTGBM->2.0.ZU;2-Q
Abstract
CuInSe2 (CIS) thin films have been deposited by MOCVD process, with co ntrolled thickness and composition. Copper precursors based on hexaflu oroacetylacetonato copper (Cu(hfa)(2)) have been specially developed. By varying the experimental parameters, a large range of compositions were investigated. Stoichiometric CIS layers present a high absorption in the visible range with an optical bandgap around 1 eV. When moving away from the stoichiometry, the films exhibit a mixture of two phase s. The Cu-rich films are composed of Cu2-xSe (x approximate to 0.15) a nd CIS while on the indium-rich side, the CuIn3Se5 phase is appearing along with CIS. This phase itself has also been obtained and character ized. The different properties of all these films are detailed. The fi rst solar cells, based on CIS grown by MOCVD, have been achieved. (C) 1998 Elsevier Science S.A. All rights reserved.