COMPLEMENTARY STM AND TEM INVESTIGATIONS OF THIN PD-FILMS

Thin Pd-films are prepared under UHV-conditions onto quartz and NaCl s ubstrates at various temperatures up to T-s = 670 K. The topography of these films is investigated by in situ STM (Scanning Tunneling Micros cope) and the morphology (ex situ) by TEM (Transmission Electron Micro scopy). Pd-films condensed onto quartz substrates are polycrystalline as revealed by TEM. The morphology of these films is consistent with t heir topography as obtained by STM measurements. Pd-films grown onto N aCl at temperatures above 500 K are single crystalline. In contrast to the polycrystalline Pd-films, the surface topography of the single cr ystalline films is rather different from what the morphology would sug gest. We thus propose that for a complete characterization of thin fil ms, both STM and TEM investigations are necessary. (C) 1998 Elsevier S cience S.A. All rights reserved.