PULSED-LASER DEPOSITION OF BISMUTH IN THE PRESENCE OF DIFFERENT AMBIENT ATMOSPHERES

Citation
Mo. Boffoue et al., PULSED-LASER DEPOSITION OF BISMUTH IN THE PRESENCE OF DIFFERENT AMBIENT ATMOSPHERES, Thin solid films, 322(1-2), 1998, pp. 132-137
Citations number
33
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
322
Issue
1-2
Year of publication
1998
Pages
132 - 137
Database
ISI
SICI code
0040-6090(1998)322:1-2<132:PDOBIT>2.0.ZU;2-3
Abstract
Bismuth thin films have been deposited at 200 degrees C on glass subst rates using the pulsed laser deposition (PLD) technique with a high en ergy density (8 J/cm(2)). Influences on the film morphologies, topogra phies and crystallographic structures of different background atmosphe res during deposition (vacuum, low He or N-2 pressures (10(-6)-10(-7) mbar)) introduced in the chamber either in a dynamic way or under stat ic conditions were investigated. Film growth is processed differently, depending on ambient atmosphere. Well-crystallized, polycrystalline b ismuth films presenting completely random-oriented crystallites are ob tained whereas more conventional deposition techniques favour c-axis o rientation. (C) 1998 Elsevier Science S.A. All rights reserved.