Bismuth thin films have been deposited at 200 degrees C on glass subst
rates using the pulsed laser deposition (PLD) technique with a high en
ergy density (8 J/cm(2)). Influences on the film morphologies, topogra
phies and crystallographic structures of different background atmosphe
res during deposition (vacuum, low He or N-2 pressures (10(-6)-10(-7)
mbar)) introduced in the chamber either in a dynamic way or under stat
ic conditions were investigated. Film growth is processed differently,
depending on ambient atmosphere. Well-crystallized, polycrystalline b
ismuth films presenting completely random-oriented crystallites are ob
tained whereas more conventional deposition techniques favour c-axis o
rientation. (C) 1998 Elsevier Science S.A. All rights reserved.