K. Uehara et al., REDOX REACTION AT THE 2-LAYER INTERFACE BETWEEN ALUMINUM AND ELECTROPOLYMERIZED POLY(3-METHYLTHIOPHENE) THIN SOLID FILMS, Thin solid films, 322(1-2), 1998, pp. 198-205
The corrosion of an aluminum (Al) layer vacuum-deposited onto the elec
tropolymerized poly(3-methylthiophene) (PMeT) film grown on the gold e
lectrode was studied by visible absorption, ESR spectroscopy and XPS a
nd by SEM analysis from the viewpoint of the redox reaction in the dar
k at the two-layer interface between Al and PMeT for the Al/doped PMeT
/Au sandwich cell. The electrochemical undoping of the perchlorate ani
ons from a PMeT induced a remarkable suppression of the redox reaction
at the two-layer interface leading to avoid a corrosion of Al electro
de vacuum-deposited onto the PMeT film. It was suggested that the rect
ifying and photovoltaic effects for the Au/undoped PMeT/Al sandwich ce
ll might be explained under the light of the redox reaction between Al
and PMeT under biased voltage and under photo-illumination, respectiv
ely. (C) 1998 Elsevier Science S.A. All rights reserved.