WAVE-GUIDING PULSED-LASER DEPOSITED TI-SAPPHIRE LAYERS ON QUARTZ

Waveguiding thin films of Ti:sapphire were successfully grown on quart z substrates by the technique of pulsed laser deposition from crystall ine targets of various Ti2O3 concentrations. The XRD spectra, titanium concentration, index of refraction, waveguiding properties and losses , and luminescence spectrum of films were studied. The refractive inde x of the films increases by 0.002 with change of dopant concentration of 0.37 wt.% of Ti2O3. The waveguide losses of a value of similar to 6 .5 dB/cm for 1 mu m film thickness were measured. (C) 1998 Elsevier Sc ience S.A. All rights reserved.