NANOSCALE MICROSTRUCTURAL ANALYSES BY ATOM-PROBE FIELD-ION MICROSCOPY

Recent progress in atom probe field ion microscopy (APFIM) and its app lications to nanoscale microstructural studies of metallic materials a re reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with al most an atomic resolution, and chemical analysis of interfaces and nan oparticles can be made with improved accuracy in comparison with the c onventional atom probe. Unique features of atom probe field ion micros copy are demonstrated by showing recent examples of APFIM and 3DAP app lications to nanoscale characterizations of aluminum alloys, nanocryst alline magnetic materials and steels.