CHANGE IN SURFACE MORPHOLOGIES WITH PULSED-LASER-DEPOSITION-TEMPERATURE FOR SRTIO3 AND BA0.7SR0.3TIO3 THIN-FILMS ON PT ELECTRODES

Authors
Citation
N. Sugii et K. Takagi, CHANGE IN SURFACE MORPHOLOGIES WITH PULSED-LASER-DEPOSITION-TEMPERATURE FOR SRTIO3 AND BA0.7SR0.3TIO3 THIN-FILMS ON PT ELECTRODES, Thin solid films, 323(1-2), 1998, pp. 63-67
Citations number
15
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
323
Issue
1-2
Year of publication
1998
Pages
63 - 67
Database
ISI
SICI code
0040-6090(1998)323:1-2<63:CISMWP>2.0.ZU;2-5
Abstract
Change in surface morphologies due to the growth temperature at which SrTiO3 and Ba0.7Sr0.3TiO3 thin films are formed on Pt electrodes by pu lsed-laser deposition was investigated. The SrTiO3 and Ba0.7Sr0.3TiO3 films crystallized at temperatures as high as 350 and 450 degrees C, r espectively, and their dielectric constants reached values higher than 200 and 300, respectively, above these temperatures. Two types of sur face roughening were observed: one was extreme surface roughening indi cating insufficient grain growth near the crystallizing temperatures, and the other was surface roughening due to the grain growth of the Pt bottom electrode above 400 degrees C which led to an increase in the leakage-current. (C) 1998 Elsevier Science S.A. All rights reserved.