SURFACE CHARACTERIZATION OF ORIENTED SILVER FILMS ON SI(100) SUBSTRATES USING SCANNING-TUNNELING-MICROSCOPY

Authors
ALI AO KSHIRSAGAR RB DHARMADHIKARI CV
Citation
Ao. Ali et al., SURFACE CHARACTERIZATION OF ORIENTED SILVER FILMS ON SI(100) SUBSTRATES USING SCANNING-TUNNELING-MICROSCOPY, Thin solid films, 323(1-2), 1998, pp. 105-109
Citations number
23
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
323
Issue
1-2
Year of publication
1998
Pages
105 - 109
Database
ISI
SICI code
0040-6090(1998)323:1-2<105:SCOOSF>2.0.ZU;2-1
Abstract
The morphology of silver films grown at 300 degrees C in high vacuum h ave been characterized. The films consist of highly ordered (100) orie nted grains exhibiting large flat terraces with array of parallel step s. The surface roughness of the individual grains was characterized by scanning tunnelling microscopy (STM) in terms of height histograms an d height-height correlations. The results are discussed in the context of applications of these films as templates for the investigation of complex molecules. (C) 1998 Elsevier Science S.A. All rights reserved.