Pj. Werkman et al., THE FORMATION OF COPPER SULFIDE SEMICONDUCTORS INSIDE LANGMUIR-BLODGETT-FILMS OF CU(II) ION COMPLEXES, Thin solid films, 323(1-2), 1998, pp. 251-256
The fabrication of layers of copper sulphide within multilayers of cop
per complexes of the amphiphile 4-(10,12-pentacosadiynamido methyl)pyr
idine, by diffusion of H2S into the multilayers, was studied by W-VIS
spectroscopy. XPS measurements revealed that copper sulphides can be s
ynthesised which differ in stoichiometry when multilayers are used, wh
ich were built up from different subphases (CuCl2 or Cu(ClO4)(2)). The
distinct layer pattern of the Langmuir-Blodgett (LB) films is preserv
ed during the formation of the copper sulphide layers and the bilayer
distance increases slightly by about 1.8 Angstrom for the multilayers
built up from a 5 mM CuCl2 subphase, whereas for the multilayers built
up from a 5 mM Cu(ClO4)(2) subphase the bilayer distance decreases a
little by about 0.6 Angstrom after the formation of copper sulphide in
side these LB films. After polymerisation the multilayer structure is
destroyed in the case of LB films built up from the CuCl2 subphase, wh
ereas the layer structure is preserved during the polymerisation proce
ss in the case of multilayers built up from a 5 mM Cu(ClO4)(2) subphas
e. (C) 1998 Elsevier Science S.A. All rights reserved.