AN AUGMENTED-SPACE RECURSION STUDY OF THE ELECTRONIC-STRUCTURE OF ROUGH EPITAXIAL OVERLAYERS

In this communication we propose the use of the augmented-space recurs ion as an ideal methodology for the study of electronic and magnetic s tructures of rough surfaces, interfaces and overlayers. The method can take into account roughness, short-ranged clustering effects, surface dilatation and interdiffusion. We illustrate our method by an applica tion to an Fe overlayer on a Ag(100) surface.