Amorphous carbon films free of hydrogen, deposited at room temperature
by magnetron sputtering, were found to exhibit amorphous diamond char
acter. The films were studied during deposition with real time and in
situ spectroscopic ellipsometry (SE), from which the transparency, spe
ctral dependence and composition were determined. Raman spectroscopy a
nd X-ray reflectivity were also used to investigate the film type, bon
ding formation and density. In addition, stress measurements conducted
with the cantilever technique prove that the internal stresses in the
films are compressive and above 4 GPa. The results from the above tec
hniques show thar films rich in sp(3) C-C bonds are dense, highly stre
ssed and metastable. These films do nor exhibit in Raman spectra the c
haracteristic G and D bands of DLC films, but instead a new band appea
rs at about 1120 cm(-1). This band disappears when the spectra are rec
orded with higher laser intensities and the film undergoes a phase tra
nsformation. Electron diffraction patterns obtained from specimens aft
er chemical etching reveal amorphous highly deformed sp(2) and sp(3) C
-C sites, whereas the same specimens prepared with Ar ion bombardment
exhibit polycrystalline diamond structure. (C) 1998 Elsevier Science L
td. All rights reserved.