High-aspect-ratio microsystems technology (HARMST) can be implemented
by using thick photoresist technology, which requires X-ray photons fo
r exposure. This was first realized in Germany via the so-called LIGA
process. To make this process cost effective, exposures with high-ener
gy photons were introduced in 1993 via a University of Wisconsin-Brook
haven National Laboratory cooperation. The addition of a solvent bonde
d resist technology and replanarization after electroplating and X-ray
mask aligning yield a HARMST processing sequence that uses large-area
, sequential X-ray masks without diaphragms. This technology may be ap
plied to precision engineered parts which do not involve electronics.
The processing sequence is also used for high performance linear and r
otational, magnetic and electrostatic actuators. System applications i
n optics involve spectrometers and other devices. A discussion of US a
nd world wide efforts in HARMST points at increasing demands for this
type of processing tool.