NANOINDENTATION, FILM GROWTH AND BEAM FLEXURE - 3 COMPLEMENTARY TESTSFOR CHARACTERIZING THE MECHANICAL-PROPERTIES OF VERY THIN MATERIALS -APPLICATION TO ELECTRODEPOSITED NICKEL FILMS

Authors
SERGENT A POILANE C ROBERT L DELOBELLE P
Citation
A. Sergent et al., NANOINDENTATION, FILM GROWTH AND BEAM FLEXURE - 3 COMPLEMENTARY TESTSFOR CHARACTERIZING THE MECHANICAL-PROPERTIES OF VERY THIN MATERIALS -APPLICATION TO ELECTRODEPOSITED NICKEL FILMS, Journal de physique. IV, 8(P4), 1998, pp. 259-265
Citations number
17
Categorie Soggetti
Physics
Journal title
Journal de physique. IV → ACNP
ISSN journal
11554339
Volume
8
Issue
P4
Year of publication
1998
Pages
259 - 265
Database
ISI
SICI code
1155-4339(1998)8:P4<259:NFGABF>2.0.ZU;2-G