A novel magnetoelectronic device for digital applications is presented
, and characteristics of a Nonvolatile Random Access Memory (NRAM) cel
l are discussed. A prototype cell with micron dimensions and with bina
ry output states of 0 and 80 mV has been demonstrated at room temperat
ure. Device fabrication requires only two lithographic levels, one for
a Hall cross and one for an electrically isolated, microstructured bi
stable ferromagnetic him. Locally strong magnetic fringe fields from t
he edge of the film generate a Hall voltage in the semiconductor. The
sign of the fringe field, as well as the polarity of the Hall voltage,
is switched by reversing the in-plane magnetization of the ferromagne
t. The device is inverse scalable: output characteristics improve as d
imensions shrink. A high-density, solid state NRAM with nsec read, wri
te and access times could replace both DRAM and magnetic disk drives i
n most computer environments, eliminating redundancy in memory systems
.