G. Ban et al., IDENTIFICATION OF MICROSTRUCTURE EFFECTS IN MAGNETIC LOSS BEHAVIOR OF3.2-PERCENT SIFE N.O. ELECTRICAL STEELS BY MEANS OF STATISTICAL POWERLOSS MODEL, IEEE transactions on magnetics, 34(4), 1998, pp. 1174-1176
In this work systematic experiments were carried out to attempt the id
entification of microstructural effects (texture, grain size) on the p
olarization dependence of internal coercive field V-o and hysteresis l
oss P-hys, determined by statistical power loss model (SPLM). Experime
nts were performed on 0.35mm thick 3.2wt% SiFe non-oriented electrical
steel, with different grain size and almost the same crystallographic
texture. From each material Epstein samples were cut at different ang
les to the rolling direction (RD). Loss separation and fitting process
was carried out, according to the SPLM, for determining V-o and P-hys
as a function of the polarization. Three synthetic parameters were pr
oposed in the 0.3T-1.2T polarization range, where the model was found
to be valid: two coefficients P-(hys)(o) and n(1) to represent the hys
teresis loss according to an exponential law and an average value of t
he internal coercive field V-o((avg)) over the investigated polarizati
on range. The dependence of V-o((avg)), P-(hys)(o) and n(1) on the gra
in size and texture has been clearly identified, resulting in a single
texture dependent behavior for both quasistatic and dynamic propertie
s. All the results obtained from fitted Phys values were confirmed by
quasi-static measurements. A theoretical model, based on the measured
Orientation Distribution Function (ODF) has been proposed to reproduce
the obtained texture dependence.