COERCIVITY AND FREQUENCY-DEPENDENCE OF TRACK WIDTHS AND ERASE BANDS IN THIN-FILM MEDIA

To understand the data track width, erase bands and the total write wi dth as a function of coercivity and frequency in thin film media, a sy stematic study was conducted based on triple track profile (TPF) techn ique using pseudo random sequences (PRS TPF). Frequency harmonics of P RS up to 200 kfci were analyzed to reveal the frequency dependence of the track edge effects. Thin film disks used in this study have coerci vities from 1766 Oe to 2878 Oe, Single frequency recording (SF TPF) an d MFM (magnetic force microscopy) were utilized for comparison. Regard less of the nonlinear track edge effects, PRS TPF and SF TPF show good correlation over a wide coercivity and frequency range.