MICROSCOPIC MAGNETIZATION STRUCTURES AND NOISE IN SINGLE-LAYER PERPENDICULAR THIN-FILM MEDIA

Citation
Y. Honda et al., MICROSCOPIC MAGNETIZATION STRUCTURES AND NOISE IN SINGLE-LAYER PERPENDICULAR THIN-FILM MEDIA, IEEE transactions on magnetics, 34(4), 1998, pp. 1633-1635
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
34
Issue
4
Year of publication
1998
Part
1
Pages
1633 - 1635
Database
ISI
SICI code
0018-9464(1998)34:4<1633:MMSANI>2.0.ZU;2-S
Abstract
A new method to evaluate microscopic magnetization intensities has bee n developed based on a magnetic force microscopy (MFM) observation. Th e MFM tip-to-sample distance is varied to get quantitative information at the magnetic layer surface. The method is applied to investigate t he origin of medium noise in single-layer perpendicular media. The irr egular magnetization in the DC erased state and the average size of ma gnetization irregularities are quantitatively evaluated for CoCr-alloy perpendicular media with different noise characteristics.