Y. Honda et al., MICROSCOPIC MAGNETIZATION STRUCTURES AND NOISE IN SINGLE-LAYER PERPENDICULAR THIN-FILM MEDIA, IEEE transactions on magnetics, 34(4), 1998, pp. 1633-1635
A new method to evaluate microscopic magnetization intensities has bee
n developed based on a magnetic force microscopy (MFM) observation. Th
e MFM tip-to-sample distance is varied to get quantitative information
at the magnetic layer surface. The method is applied to investigate t
he origin of medium noise in single-layer perpendicular media. The irr
egular magnetization in the DC erased state and the average size of ma
gnetization irregularities are quantitatively evaluated for CoCr-alloy
perpendicular media with different noise characteristics.