STRESS-INDUCED BIREFRINGENCE IN ALL-FIBER WHITE-LIGHT INTERFEROMETERS

The phenomenon of the interference pattern splitting in an all-fiber w hite-light interferometer is investigated. It is found that the interf erence pattern will change its amplitude and shape as the fiber which farms the optical path is subjected to tension, bending, or torsion. T his leads to the interference pattern fading and deteriorates the zero -order fringe identification. An explanation based on the stress-induc ed birefringence is presented with numerical simulation results, It is shown that the periodic change in the amplitude and. shape results fr om the periodically changed phase difference between the two orthogona l LP01 modes in the presence of external loads. (C) 1998 Academic Pres s.