CHARACTERIZATION OF CEO2 THIN-FILMS ON A SAPPHIRE

Authors
SOKOLOV SV KNOTKO AV PUTLAYEV VI KAUL AR
Citation
Sv. Sokolov et al., CHARACTERIZATION OF CEO2 THIN-FILMS ON A SAPPHIRE, Superlattices and microstructures, 24(1), 1998, pp. 49-53
Citations number
4
Categorie Soggetti
Physics, Condensed Matter
Journal title
Superlattices and microstructures → ACNP
ISSN journal
07496036
Volume
24
Issue
1
Year of publication
1998
Pages
49 - 53
Database
ISI
SICI code
0749-6036(1998)24:1<49:COCTOA>2.0.ZU;2-J
Abstract
Thin layers of CeO2 were deposited on the R-plane of a sapphire substr ate. The films were tested by x-ray diffraction, scanning electron mic roscopy and transmission electron microscopy techniques. The films wer e found to be epitaxial with fine-grain morphology of the surface. (C) 1998 Academic Press.