GROWTH AND STRUCTURE OF THIN CO FILMS ON CU(111) STUDIED BY FULL-SOLID-ANGLE X-RAY PHOTOELECTRON DISTRIBUTIONS

Citation
T. Fauster et al., GROWTH AND STRUCTURE OF THIN CO FILMS ON CU(111) STUDIED BY FULL-SOLID-ANGLE X-RAY PHOTOELECTRON DISTRIBUTIONS, Physical review. B, Condensed matter, 48(15), 1993, pp. 11361-11366
Citations number
31
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
48
Issue
15
Year of publication
1993
Pages
11361 - 11366
Database
ISI
SICI code
0163-1829(1993)48:15<11361:GASOTC>2.0.ZU;2-7
Abstract
Photoelectron spectroscopy at kinetic energies of almost-equal-to 570 eV has been performed on a Cu(111) surface with Co coverages of up to 50 monolayers. The angle-integrated data indicate that tall islands de velop with Cu atoms in the top layers. The angular distributions of th e photoelectrons were measured using a display-type analyzer with an o pening angle of 88-degrees. The Co emission patterns always show some threefold symmetry corresponding to the fcc structure of the clean Cu( 111) surface. Most of the Co atoms are in the hcp structure and this f raction increases with coverage.