PIXE, PARTICLE-INDUCED X-RAY-EMISSION A CONCISE REVIEW

Authors
Citation
Ai. Garip, PIXE, PARTICLE-INDUCED X-RAY-EMISSION A CONCISE REVIEW, Turkish journal of chemistry, 22(3), 1998, pp. 183-199
Citations number
27
Categorie Soggetti
Chemistry,"Engineering, Chemical
ISSN journal
13000527
Volume
22
Issue
3
Year of publication
1998
Pages
183 - 199
Database
ISI
SICI code
1300-0527(1998)22:3<183:PPXACR>2.0.ZU;2-E
Abstract
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive an d non-destructive method which has been in use in trace elemental anal ysis since 1970. This review aims to explain the main features of PIXE . References will be given at the end for those that seek more detaile d knowledge on the principles and applications of this technique.