PHASE PROPERTIES OF A SURFACE-PLASMON RESONANCE FROM THE VIEWPOINT OFSENSOR APPLICATIONS

Citation
Ve. Kochergin et al., PHASE PROPERTIES OF A SURFACE-PLASMON RESONANCE FROM THE VIEWPOINT OFSENSOR APPLICATIONS, Quantum electronics, 28(5), 1998, pp. 444-448
Citations number
13
Categorie Soggetti
Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
10637818
Volume
28
Issue
5
Year of publication
1998
Pages
444 - 448
Database
ISI
SICI code
1063-7818(1998)28:5<444:PPOASR>2.0.ZU;2-G
Abstract
The physical picture of the behaviour of the phase of a light wave, re flected from a metal film under surface-plasmon resonance conditions, was determined theoretically and experimentally for various values of a whole series of parameters. It was found in particular that for a p- polarised wave the dependence of the phase on the angle of incidence a nd on the radiation wavelength, and also on the refractive index of a medium or on the thickness of a (bio)chemical receptor layer on the me tal surface, had a section with an abrupt jump-like change. The steepn ess of this section, i.e. the sensitivity of the phase to a change in the relevant parameter, can exceed by several orders of magnitude the steepness of the intensity resonance profile and in theory it can tend to infinity as the intensity at the reflection minimum approaches zer o. This is the basis of a discussion of promising (bio)chemical sensor methods ensuring a significantly higher sensitivity and yet the same wide dynamic range as the traditional detection of an intensity minimu m.