Ve. Kochergin et al., PHASE PROPERTIES OF A SURFACE-PLASMON RESONANCE FROM THE VIEWPOINT OFSENSOR APPLICATIONS, Quantum electronics, 28(5), 1998, pp. 444-448
The physical picture of the behaviour of the phase of a light wave, re
flected from a metal film under surface-plasmon resonance conditions,
was determined theoretically and experimentally for various values of
a whole series of parameters. It was found in particular that for a p-
polarised wave the dependence of the phase on the angle of incidence a
nd on the radiation wavelength, and also on the refractive index of a
medium or on the thickness of a (bio)chemical receptor layer on the me
tal surface, had a section with an abrupt jump-like change. The steepn
ess of this section, i.e. the sensitivity of the phase to a change in
the relevant parameter, can exceed by several orders of magnitude the
steepness of the intensity resonance profile and in theory it can tend
to infinity as the intensity at the reflection minimum approaches zer
o. This is the basis of a discussion of promising (bio)chemical sensor
methods ensuring a significantly higher sensitivity and yet the same
wide dynamic range as the traditional detection of an intensity minimu
m.