Ct. Foxon et Oh. Hughes, THE CURRENT STATUS OF PLASMA-ASSISTED MBE GROWTH OF GROUP III-NITRIDES, Journal of materials science. Materials in electronics, 9(3), 1998, pp. 227-230
This article outlines very briefly our present state of knowledge conc
erning the growth and characterization of group Ill-nitrides by plasma
assisted molecular beam epitaxy (PA-MBE) and also discusses the appli
cation of MBE for devices. We begin with a discussion of our current k
nowledge of the growth kinetics for both binary compounds (AlN, GaN an
d InN) and for alloys with mixed group III (InGaN and AlGaN) and group
V (AlAsN and GaAsN) elements. We emphasize the important role that th
e choice of substrates, stoichiometry and buffer layers play in determ
ining the morphology of GaN. We comment briefly on the problems of dop
ing group III-nitrides, particularly p-type, and finally we mention th
e present status of devices grown by MBE compared with similar devices
grown by metal-organic vapour phase epitaxy (MOVPE). (C) 1998 Chapman
& Hall.