THE CURRENT STATUS OF PLASMA-ASSISTED MBE GROWTH OF GROUP III-NITRIDES

Citation
Ct. Foxon et Oh. Hughes, THE CURRENT STATUS OF PLASMA-ASSISTED MBE GROWTH OF GROUP III-NITRIDES, Journal of materials science. Materials in electronics, 9(3), 1998, pp. 227-230
Citations number
18
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
09574522
Volume
9
Issue
3
Year of publication
1998
Pages
227 - 230
Database
ISI
SICI code
0957-4522(1998)9:3<227:TCSOPM>2.0.ZU;2-C
Abstract
This article outlines very briefly our present state of knowledge conc erning the growth and characterization of group Ill-nitrides by plasma assisted molecular beam epitaxy (PA-MBE) and also discusses the appli cation of MBE for devices. We begin with a discussion of our current k nowledge of the growth kinetics for both binary compounds (AlN, GaN an d InN) and for alloys with mixed group III (InGaN and AlGaN) and group V (AlAsN and GaAsN) elements. We emphasize the important role that th e choice of substrates, stoichiometry and buffer layers play in determ ining the morphology of GaN. We comment briefly on the problems of dop ing group III-nitrides, particularly p-type, and finally we mention th e present status of devices grown by MBE compared with similar devices grown by metal-organic vapour phase epitaxy (MOVPE). (C) 1998 Chapman & Hall.