F. Dhondt et al., TRANSIENT ANALYSIS OF COLLECTOR CURRENT COLLAPSE IN MULTIFINGER HBTS, IEEE microwave and guided wave letters, 8(8), 1998, pp. 272-274
The authors report for the first time a time-domain analysis of therma
l instability in multifinger heterojunction bipolar transistors (HBT's
). This is based on a transient quasi-three-dimensional (3-D) electrot
hermal model that selfconsistently solves the thermal and electrical e
quations, This model is designed to evaluate the thermal time constant
of GaAs-based power HBT's employing emitter thermal shunt and emitter
ballast resistance.