ATOMIC-FORCE MICROSCOPY IMAGING OF THE GROWTH FEATURES ON THE SURFACEOF RUTILE

Atomic force microscopy and X-ray diffraction were used to examine the surface topography of oxide layers formed on pure titanium. Oxide gro wn in air at 1173 K exhibits a structure of rutile (TiO2) and a strong texture of {110} planes aligned perpendicular to the growth direction . The growth surface is covered with well defined pyramids, twisted wi th respect to each other. Cross-sectional analysis indicates that the sidewalls of these pyramids consist of both lateral macro and numerous nano-size growth ledges. The mechanism of oxide growth on titanium is discussed. (C) 1998 Elsevier Science Ltd. All rights reserved.