X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF THE BOUND-STATE ELECTRONIC-TRANSITIONS AT THE VANADIUM-K AND VANADIUM-L EDGES IN LOW-SYMMETRY, MOLECULAR, VANADIUM-(IV) AND VANADIUM-(V) COMPLEXES WITH OXYOXIME AND OXYOXIMATE LIGANDS
D. Collison et al., X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF THE BOUND-STATE ELECTRONIC-TRANSITIONS AT THE VANADIUM-K AND VANADIUM-L EDGES IN LOW-SYMMETRY, MOLECULAR, VANADIUM-(IV) AND VANADIUM-(V) COMPLEXES WITH OXYOXIME AND OXYOXIMATE LIGANDS, Journal of the Chemical Society. Dalton transactions, (13), 1998, pp. 2199-2204
A combination of vanadium K- and L-edge XAFS has been used to characte
rise a series of monomeric oxovanadium(Iv), monomeric dioxovanadium(v)
and dimeric oxovanadium(v) complexes with oxyoxime and oxyoximate lig
ands. The K- and L-edge spectra confirm the presence of VV in the dime
ric species and the L-edge spectra have been used to discriminate betw
een six-co-ordinate V-N-O-V bridged oxovanadium(v) dimers and seven-co
-ordinate phenolate bridged oxovanadium(v) dimers containing eta(2)-N-
O groups.