X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF THE BOUND-STATE ELECTRONIC-TRANSITIONS AT THE VANADIUM-K AND VANADIUM-L EDGES IN LOW-SYMMETRY, MOLECULAR, VANADIUM-(IV) AND VANADIUM-(V) COMPLEXES WITH OXYOXIME AND OXYOXIMATE LIGANDS

Citation
D. Collison et al., X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF THE BOUND-STATE ELECTRONIC-TRANSITIONS AT THE VANADIUM-K AND VANADIUM-L EDGES IN LOW-SYMMETRY, MOLECULAR, VANADIUM-(IV) AND VANADIUM-(V) COMPLEXES WITH OXYOXIME AND OXYOXIMATE LIGANDS, Journal of the Chemical Society. Dalton transactions, (13), 1998, pp. 2199-2204
Citations number
33
Categorie Soggetti
Chemistry Inorganic & Nuclear
ISSN journal
03009246
Issue
13
Year of publication
1998
Pages
2199 - 2204
Database
ISI
SICI code
0300-9246(1998):13<2199:XFSOTB>2.0.ZU;2-N
Abstract
A combination of vanadium K- and L-edge XAFS has been used to characte rise a series of monomeric oxovanadium(Iv), monomeric dioxovanadium(v) and dimeric oxovanadium(v) complexes with oxyoxime and oxyoximate lig ands. The K- and L-edge spectra confirm the presence of VV in the dime ric species and the L-edge spectra have been used to discriminate betw een six-co-ordinate V-N-O-V bridged oxovanadium(v) dimers and seven-co -ordinate phenolate bridged oxovanadium(v) dimers containing eta(2)-N- O groups.