We have investigated the effect of very thin SiC layer formation on Si
(001) for cubic GaN growth by RF plasma-assisted molecular beam epita
xy. It is found that a cubic GaN film can be epitaxially grown on Si (
001) covered with an approximately 2.5-nm-thick cubic SIC layer, while
GaN grown on Si (001) without such an SIC layer results in the polycr
ystal growth of a predominantly hexagonal phase. In the latter case, a
n approximately 1-nm-thick amorphous Si layer is formed at the interfa
ce between GaN and Si by the irradiation of nitrogen plasma.